Ion Beam Removal of Surface Contamination in Genesis Samples

Details Ion Beam Removal of Surface Contamination in Genesis Samples Ion Beam Removal of Surface Contamination in Genesis Samples

Mar 2010

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2010lpi....41.1975k&link_type=abstract

41st Lunar and Planetary Science Conference, held March 1-5, 2010 in The Woodlands, Texas. LPI Contribution No. 1533, p.1975

Physics

2

Scientific paper

Surface contamination of Genesis samples limits our ability to
accurately measure solar wind fluences. We show using AFM, TXRF,
interferometry and RIMS depth profiling that cluster ion sputtering can
successfully remove such contamination.

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