Instantaneous phase-shifted speckle interferometer for measurement of large optical structures

Details Instantaneous phase-shifted speckle interferometer for measurement of large optical structures Instantaneous phase-shifted speckle interferometer for measurement of large optical structures

Sep 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004spie.5494..152s&link_type=abstract

Optical Fabrication, Metrology, and Material Advancements for Telescopes, Edited by E. Atad-Ettedgui and P. Dierickx. Procee

Physics

Scientific paper

Digital Speckle Pattern Interferometry (DSPI) is a well-established method for the measurement of diffuse objects in experimental mechanics. DSPIs are phase shifting interferometers. Three or four bucket temporal phase shifting algorithms are commonly used to provide phase shifting. These algorithms are sensitive to vibrations and can not be used to measure large optical structures far away from the interferometer. In this research a simultaneous phase shifted interferometer, PhaseCam product of 4D Technology Corporation in Tucson Arizona, is modified to be a Simultaneous phase shifted Digital Speckle Pattern Interferometer (SDSPI). Repeatability, dynamic range, and accuracy of the SDSPI are characterized by measuring a 5 cm x 5 cm carbon fiber coupon.

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