Incident angle dependence of backscattered light by regolith layers

Details Incident angle dependence of backscattered light by regolith layers Incident angle dependence of backscattered light by regolith layers

Jan 1999

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999adspr..23.1205k&link_type=abstract

Advances in Space Research, Volume 23, Issue 7, p. 1205-1208.

Physics

5

Scientific paper

We have performed laboratory measurements of backscattered light by regolith layers to investigate the scattering properties of surfaces with regolith particles such as an asteroid surface. The samples used for our measurements are different types of surfaces consisting of alumina (Al2O3) plates, particles, and combination of both. We measured the backscattered light reflectance by varying the incident angle to the surface at small phase angle (1°). The reflected light from the plates covered by the thin layer of the particles has an effect of Fresnel specular reflection by the plates at small incident angle, and decreases as the incident angle increases but the rate of decrease is smaller than that of the bare plates. The results of our measurements will be used as the reference data for in situ photometric observations by a CCD camera onboard MUSES-C, the Japanese asteroid sample return mission which will be launched in 2002.

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