In situ nanoparticle diagnostics by multi-wavelength Rayleigh-Mie scattering ellipsometry

Details In situ nanoparticle diagnostics by multi-wavelength Rayleigh-Mie scattering ellipsometry In situ nanoparticle diagnostics by multi-wavelength Rayleigh-Mie scattering ellipsometry

Apr 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003njph....5...38g&link_type=abstract

New Journal of Physics, Volume 5, Issue 1, pp. 38 (2003).

Physics

6

Scientific paper

We present and discuss the method of multiple-wavelength Rayleigh-Mie scattering ellipsometry for the in situ analysis of nanoparticles. It is applied to the problem of nanoparticles suspended in low-pressure plasmas. We discuss experimental results demonstrating that the size distribution and the complex refractive index can be determined with high accuracy and present a study on the in situ analysis of etching of melamine-formaldehyde nanoparticles suspended in an oxygen plasma. It is also shown that particles with a shell structure (core plus mantle) can be analysed by Rayleigh-Mie scattering ellipsometry. Rayleigh-Mie scattering ellipsometry is also applicable to in situ analysis of nanoparticles under high gas pressures and in liquids.

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