In-flight Calibration of SOHO EIT

Details In-flight Calibration of SOHO EIT In-flight Calibration of SOHO EIT

May 2001

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2001agusm..sp21b06n&link_type=abstract

American Geophysical Union, Spring Meeting 2001, abstract #SP21B-06

Physics

7509 Corona, 7594 Instruments And Techniques

Scientific paper

The SOHO EIT response has varied both temporally and spatially throughout the mission. A large effort has been put forth into understanding instrument responsivity changes, the spectral response and absolute calibration. The latter two have been completed (Dere et al. 2000, Newmark 2000). The response degradation process consists of several components which are difficult to separate in detail. The two basic processes contributing to the degradation are 1) the absorption of EUV before it interacts with the CCD by a surface contaminant plus possible blackening of the entrance filter and 2) the reduction of charge collection efficiency (CCE) in the CCD due to EUV induced device damage. A method utilizing the in-flight calibration lamps has been developed which accurately characterizes the sensitivity changes. We present absolutely calibrated SOHO EIT data from 1996 - 2000.

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