Improved PI-network measurement of all quartz crystal parameters by appropriate modelling of the test fixture

Details Improved PI-network measurement of all quartz crystal parameters by appropriate modelling of the test fixture Improved PI-network measurement of all quartz crystal parameters by appropriate modelling of the test fixture

Jun 1992

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1992esasp.340..111n&link_type=abstract

In ESA, Frequency and Time Forum p 111-117 (SEE N93-24978 09-70)

Physics

Algorithms, Electrical Measurement, Mathematical Models, Parameterization, Quartz Crystals, Standards, Capacitance, Crosstalk, Electric Connectors, Electrical Impedance, Inductance

Scientific paper

The measurement of quartz crystal units is standardized in IEC 444. This means that different test fixtures and additional elements must be used, for example in the determination of the load resonance parameters (IEC 444-4) or for the physical static capacitance compensation (IEC 444-3). A method introducing a general approach, which allows the precise determination of all quartz crystal parameters with one test fixture only by appropriate modeling, is presented: inductances in series to the inserted crystal modeling the electrical connection; a capacitance between the PI network ports modeling the crosstalk; and complex impedance of the PI network. All these elements are computed by a calibration routine with an open, a short, and a calibration resistor in the complete frequency range. The quartz crystal parameters are determined by complex mathematical algorithms for the measurement data. Measurement results with different hardware are presented in comparison to the standardized hardware based methods of IEC 444.

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