Imaging of carrier-envelope phase effects in above-threshold ionization with intense few-cycle laser fields

Details Imaging of carrier-envelope phase effects in above-threshold ionization with intense few-cycle laser fields Imaging of carrier-envelope phase effects in above-threshold ionization with intense few-cycle laser fields

Feb 2008

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008njph...10b5024k&link_type=abstract

New Journal of Physics, Volume 10, Issue 2, pp. 025024 (2008).

Physics

29

Scientific paper

Sub-femtosecond control of the electron emission in above-threshold ionization of the rare gases Ar, Xe and Kr in intense few-cycle laser fields is reported with full angular resolution. Experimental data that were obtained with the velocity-map imaging technique are compared to simulations using the strong-field approximation (SFA) and full time-dependent Schrödinger equation (TDSE) calculations. We find a pronounced asymmetry in both the energy and angular distributions of the electron emission that critically depends on the carrier-envelope phase (CEP) of the laser field. The potential use of imaging techniques as a tool for single-shot detection of the CEP is discussed.

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