Image-plane incidence for a baffled infrared telescope

Details Image-plane incidence for a baffled infrared telescope Image-plane incidence for a baffled infrared telescope

Mar 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997inpht..38...87s&link_type=abstract

Infrared Physics & Technology, Volume 38, Issue 2, p. 87-92.

Physics

13

Scientific paper

The on-axis image plane incidence of an extended object (sometimes also called irradiance), radiating as a Lambertian radiator is derived for an optical system with a central obscuration. It is then extended to off-axis image points to obtain a generalized form of image incidence for an extended source. A specific example is provided by the conceptual design proposed for the next generation US IR telescope facility, called SIRTF. An incidence error of 1% is obtained for a telescope with a large baffle around a small secondary mirror. The small error is attributed to the unusually small diameter of the secondary mirror.

Affiliated with

Also associated with

No associations

Rating

Image-plane incidence for a baffled infrared telescope does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Image-plane incidence for a baffled infrared telescope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Image-plane incidence for a baffled infrared telescope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-870526