Identification of Charge Collection Limiting Centres in Detector-Grade Cvd Diamond

Details Identification of Charge Collection Limiting Centres in Detector-Grade Cvd Diamond Identification of Charge Collection Limiting Centres in Detector-Grade Cvd Diamond

Jul 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004apsp.conf..489m&link_type=abstract

ASTROPARTICLE, PARTICLE AND SPACE PHYSICS, DETECTORS AND MEDICAL PHYSICS APPLICATIONS. Proceedings of the 8th Conference. Held 6

Physics

Medical Physics

Scientific paper

CVD diamond detectors feature a radiation hardness among the highest. Their main drawback is a low Charge Collection Efficiency, due to carrier trapping. In this article we present new CCE measurements on high- and medium-quality CVD diamond detectors, aimed at a deeper comprehension of charge trapping processes. We performed a characterization of CCE and radiation induced current. We explained our results by modelizing charge traps as two bands of deep levels at 1.7 eV and 2.5 eV from the band edge. A band of shallow levels is also shown to be present. We also present a study of the radiation-induced priming dynamics, which gave an evidence for a polarization effect, competitive with the priming itself.

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