High S/N Capability Characterization

Details High S/N Capability Characterization High S/N Capability Characterization

Jul 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002hst..prop.9642g&link_type=abstract

HST Proposal ID #9642

Physics

Hst Proposal Id #9642

Scientific paper

We wish to characterize the high S/N capability for NICMOS grism spectroscopy analogous to experiments doing similar for STIS. With the grism and NIC 3 a limiting factor will be undersampling coupled with minor guiding errors. Either very stable guiding and no dithering is preferred with resulting goal of only a differential measure for changes in spectra over time, or dithering to a large number of different offsets and hence averaging over undersampling effects is desired. S/N will be tested in both sum over wavelength and cross-dispersion mode and for exposure to exposure and orbit to orbit for spectral fidelity as well. We adopt defocus using the PAM to minimize undersampling at the cost of lost spectral resolution. Only 0.1 pixel dithers are included to assist with decorrelation of any residual intensity with guiding error induced changes.

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