High-resolution x-ray scattering measurements: I. Surfaces

Details High-resolution x-ray scattering measurements: I. Surfaces High-resolution x-ray scattering measurements: I. Surfaces

Oct 2000

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000rpph...63.1725d&link_type=abstract

Reports on Progress in Physics, Volume 63, Issue 10, pp. 1725-1777 (2000).

Physics

26

Scientific paper

X-ray scattering investigations of surfaces and interfaces in soft-condensed matter are reviewed. Both high-resolution structural determinations in the direct space and investigations of fluctuations with long-range correlations requiring a high resolution in the Fourier space are discussed. All the scattering cross-sections for diffraction or diffuse scattering are derived within a unified frame, and the experimental aspects related to their measurement are discussed in detail. The general principles are illustrated by various examples of studies of the liquid-vapour interface, Langmuir and Langmuir-Blodgett films, wetting films, polymer films, liquid crystals and liquid-liquid interfaces.

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