High-resolution electron-energy-loss spectroscopy of thin films of C60 on Si(100)

Details High-resolution electron-energy-loss spectroscopy of thin films of C60 on Si(100) High-resolution electron-energy-loss spectroscopy of thin films of C60 on Si(100)

Oct 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991phrvl..67.2171g&link_type=ejournal

Physical Review Letters, Volume 67, Issue 16, October 14, 1991, pp.2171-2174

Physics

165

Exchange, Correlation, Dielectric And Magnetic Response Functions, Plasmons, Molecular Spectra, Molecular Excitation And Ionization By Electron Impact, Electron Diffraction And Scattering

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