High Precision Ionization Chamber for Relative Intensity Monitoring of Synchrotron Radiation

Details High Precision Ionization Chamber for Relative Intensity Monitoring of Synchrotron Radiation High Precision Ionization Chamber for Relative Intensity Monitoring of Synchrotron Radiation

1999-10-22

arxiv.org/abs/physics/9910033v1

Physics

Instrumentation and Detectors

10 pages, 8 figures

Scientific paper

10.1016/S0168-9002(99)01385-6

A single channel, high precision ionization chamber has been built for monitoring the relative intensity of X-rays in the energy range above 5 keV. It can be used in experiments, such as EXAFS, where simultaneous high precision monitoring of the relative intensity during the actual experiment is required. In this paper the construction of the chamber and its performance during test measurements with an X-ray tube are presented.

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