High-energy characterization of multilayers for hard x-ray astronomy

Details High-energy characterization of multilayers for hard x-ray astronomy High-energy characterization of multilayers for hard x-ray astronomy

Jan 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002spie.4496..134i&link_type=abstract

Proc. SPIE Vol. 4496, p. 134-139, X-Ray Optics for Astronomy: Telescopes, Multilayers, Spectrometers, and Missions, Paul Gorenst

Physics

Optics

Scientific paper

We report the results obtained during the second phase of a program which consists of comparing the performance of different multilayer material combinations. These coatings will be used to extend the bandpass of current hard X-ray optics toward 100 keV, an order of magnitude higher than present technology. The materials studied here are W/Si, Pt/C, and W/C. A comparison of the performance of depth graded multilayers of these different materials at energies 30-80 keV was undertaken. Specular reflectivity data were acquired at 30-80 keV using the X17B1 beamline of the National Synchrotron Light Source. Reflectivity versus energy plots showed a high enough reflectivity for the bandpass of interest at grazing angles typical for hard x-ray telescope mirror shells. The next phase of our program will continue with similar high-energy pencil beam measurements on multilayer coated telescope prototype shells.

Affiliated with

Also associated with

No associations

Rating

High-energy characterization of multilayers for hard x-ray astronomy does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with High-energy characterization of multilayers for hard x-ray astronomy, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High-energy characterization of multilayers for hard x-ray astronomy will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1689012