Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

Details Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

2007-09-04

arxiv.org/abs/0709.0533v1

Rev.Sci.Instrum.78:103707,2007

Physics

Instrumentation and Detectors

13 pages

Scientific paper

10.1063/1.2801009

Torsional harmonic cantilevers allow measurement of time varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force waveform with the use of non-linear dynamical response of the tapping cantilever. Specifically the transitions between steady oscillation regimes are used to calibrate the torsional deflection signals.

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