Hard x-ray calibration facility design for JEM-X detector on board INTEGRAL

Details Hard x-ray calibration facility design for JEM-X detector on board INTEGRAL Hard x-ray calibration facility design for JEM-X detector on board INTEGRAL

Oct 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.3114..404p&link_type=abstract

Proc. SPIE Vol. 3114, p. 404-411, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII, Oswald H. Siegmund; Mark A. Gumm

Astronomy and Astrophysics

Astronomy

2

Scientific paper

The x-ray monitor JEM-X will be flown aboard the ESA mission INTEGRAL for gamma-ray astronomy. It has been conceived to furnish images of celestial sources in fields of the sky 9.1 deg wide in the 3 - 100 keV extended energy band. Careful on- ground calibrations are needed to verify the spectral capabilities of the JEM-X detector. These operations in the 20 - 100 keV energy band are planned to be performed using a hard x-ray (15 - 140 keV) facility operated at University of Ferrara (Italy). We present the apparatus that will be used to carry out these calibrations. In particular we describe a double-reflection fixed-exit system of monochromatization based on silicon crystals that are implemented in the facility.

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