Guidelines for predicting single-event upsets in neutron environments

Details Guidelines for predicting single-event upsets in neutron environments Guidelines for predicting single-event upsets in neutron environments

Dec 1991

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1991itns...38.1500l&link_type=abstract

(1991 IEEE Annual Conference on Nuclear and Space Radiation Effects, 28th, San Diego, CA, July 15-19, 1991, Proceedings. A92-240

Physics

21

Extraterrestrial Radiation, Neutron Irradiation, Single Event Upsets, Bit Error Rate, Energetic Particles, Heavy Nuclei, Radioisotope Batteries

Scientific paper

A simple, graphical technique for estimating SEU rates in most neutron environments is provided. The technique is based on recently improved burst generation rate estimates for silicon. The method considers the point energy deposition from elastic, inelastic, and spallation reactions of neutrons in silicon over a wide range of incident energies (0.1 MeV to 1000 MeV). Alpha-particle energy deposition, which may cause errors in some devices, varies nonlinearly with increasing sensitive volume and is not considered.

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