Physics
Scientific paper
Dec 2005
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005agufmsh33a0366b&link_type=abstract
American Geophysical Union, Fall Meeting 2005, abstract #SH33A-0366
Physics
1027 Composition Of The Planets, 1060 Planetary Geochemistry (5405, 5410, 5704, 5709, 6005, 6008), 2162 Solar Cycle Variations (7536), 2164 Solar Wind Plasma, 2169 Solar Wind Sources
Scientific paper
We have used synchrotron-based Total-reflection X-Ray Fluorescence (TXRF) to measure the surface and near-surface contamination of Genesis flight spare material as well as one piece of sapphire which flew on the mission. Flight spare samples included uncoated, Al-coated and Au-coated sapphire wafers and diamond-like carbon (DLC) on silicon. These studies were performed to determine the suitability of TXRF for the study of Genesis materials. The technique is optimally suited and highly surface sensitive for elements between Na and Br with sensitivities ranging from 1e9 to 1e12 atoms/cm2. By changing the x-ray angle of incidence one can vary the sampling depth from ~ 100 Å to several thousand Å. We found that the level of contamination of the flight-spare material varied widely. For the case of the returned piece of sapphire there were concentrations of Ge on the surface approaching monolayer coverage.
Brennan Sean
Burnett Don S.
Ishii Hope A.
Luening Katharina
Pianetta Piero
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