Genesis Preliminary Examination -- Ellipsometry Overview

Details Genesis Preliminary Examination -- Ellipsometry Overview Genesis Preliminary Examination -- Ellipsometry Overview

Mar 2005

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005lpi....36.2145s&link_type=abstract

36th Annual Lunar and Planetary Science Conference, March 14-18, 2005, in League City, Texas, abstract no.2145

Physics

2

Scientific paper

Spectroscopic Ellipsometry is a measurement technique using polarized
light to characterize thin films, surfaces, and material microstructure.
We will explain this technique as it pertains to preliminary examination
of Genesis collector materials.

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