Frequency Scanned Interferometry for ILC Tracker Alignment

Details Frequency Scanned Interferometry for ILC Tracker Alignment Frequency Scanned Interferometry for ILC Tracker Alignment

2011-09-12

arxiv.org/abs/1109.2582v1

Physics

Instrumentation and Detectors

8 pages, Proceedings for the DPF-2011 Conference, Providence, RI, August 8-13, 2011

Scientific paper

In this paper, we report high-precision absolute distance and vibration measurements performed with frequency scanned interferometry. Absolute distance was determined by counting the interference fringes produced while scanning the laser frequency. High-finesse Fabry-Perot interferometers were used to determine frequency changes during scanning. A dual-laser scanning technique was used to cancel drift errors to improve the absolute distance measurement precision. A new dual-channel FSI demonstration system is also presented which is an interim stage toward practical application of multi-channel distance measurement. Under realistic conditions, a precision of 0.3 microns was achieved for an absolute distance of 0.57 meters. A possible optical alignment system for a silicon tracker is also presented.

Affiliated with

Also associated with

No associations

Rating

Frequency Scanned Interferometry for ILC Tracker Alignment does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Frequency Scanned Interferometry for ILC Tracker Alignment, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Frequency Scanned Interferometry for ILC Tracker Alignment will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-60831