Fourier transform emission spectroscopy at 13 microns - Vibration-rotation spectrum of SiS

Details Fourier transform emission spectroscopy at 13 microns - Vibration-rotation spectrum of SiS Fourier transform emission spectroscopy at 13 microns - Vibration-rotation spectrum of SiS

Oct 1990

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990jchph..93.5457f&link_type=abstract

Journal of Chemical Physics (ISSN 0021-9606), vol. 93, Oct. 15, 1990, p. 5457-5461. Research supported by the Petroleum Research

Physics

Chemical Physics

23

Emission Spectra, Fourier Transformation, Inorganic Sulfides, Molecular Rotation, Silicon Compounds, Vibrational Spectra, Carbon Monoxide, High Temperature, Infrared Spectra

Scientific paper

Fourier transform spectrometry has been used to record the rovibrational emission spectrum of SiS at 13 microns, demonstrating the technique's general applicability to similar high temperature species. Mass-reduced Dunham parameters have been derived for seven bands of the main isotopic form, Si-28S-32, together with three bands each for each of the minor species Si-29S-32, Si-30S-32, and Si-28S34. The parameters obtained encompass Watson's correction due to the breakdown of the Born-Oppenheimer approximation.

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