Four-path interference and uncertainty principle in photodetachment microscopy

Details Four-path interference and uncertainty principle in photodetachment microscopy Four-path interference and uncertainty principle in photodetachment microscopy

2001-06-12

arxiv.org/abs/quant-ph/0106061v1

Europhysics Letters, vol. 56 (4), pp. 471-477 (2001)

Physics

Quantum Physics

submitted to Europhysics Letters

Scientific paper

10.1209/epl/i2001-00543-x

We study the quantal motion of electrons emitted by a pointlike monochromatic isotropic source into parallel uniform electric and magnetic fields. The two-path interference pattern in the emerging electron wave due to the electric force is modified by the magnetic lens effect which periodically focuses the beam into narrow filaments along the symmetry axis. There, four classical paths interfere. With increasing electron energy, the current distribution changes from a quantum regime governed by the uncertainty principle, to an intricate spatial pattern that yields to a semiclassical analysis.

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