Focused-Ion-Beam-Assisted Bipolar Transistor Characterization and Analog Single-Event-Transient Circuit Analysis of the OP-27

Details Focused-Ion-Beam-Assisted Bipolar Transistor Characterization and Analog Single-Event-Transient Circuit Analysis of the OP-27 Focused-Ion-Beam-Assisted Bipolar Transistor Characterization and Analog Single-Event-Transient Circuit Analysis of the OP-27

Oct 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004esasp.536..133r&link_type=gif

Radiation and its Effects on Components and Systems, RADECS 2003, Proceedings of the 7th European Conference, held 15-19 Septemb

Computer Science

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