Computer Science
Scientist
Comparison of Single-Event Transients Induced in an Operational Amplifier (LM124) by Pulsed Laser Light and a Broad Beam of Heavy Ions
Focused-Ion-Beam-Assisted Bipolar Transistor Characterization and Analog Single-Event-Transient Circuit Analysis of the OP-27
Mitigation of Single-Event Transients in CMOS Digital Circuits
System-Level Design Hardening Based on Worst-Case ASET Simulations
Validity of Using a Fixed Analog Input for Evaluating the SEU Sensivity of a Flash Analog-to-Digital Converter
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