Physics – Atomic Physics
Scientific paper
Nov 1989
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1989spie.1159..382v&link_type=abstract
IN: EUV, X-ray, and gamma-ray instrumentation for astronomy and atomic physics; Proceedings of the Meeting, San Diego, CA, Aug.
Physics
Atomic Physics
3
Extreme Ultraviolet Explorer Satellite, Microchannel Plates, Ultraviolet Detectors, Extreme Ultraviolet Radiation, Imaging Techniques, Photocathodes
Scientific paper
The results of the extreme ultraviolet (EUV) flat field calibrations of two of the flight detectors to be flown on the Extreme Ultraviolet Explorer Satellite (EUVE) are presented. Images of about 40 million detected events binned 512 by 512 are sufficient to show microchannel plate fixed pattern noise such as hexagonal microchannel multifiber bundle interfaces, 'dead' spots, edge distortion, and differential nonlinearity. Differences due to photocathode material and dependencies on EUV wavelength are also described. Over large spatial scales, the detector response is flat to better than 10 percent of the mean response, but, at spatial scales less than 1 mm, the variations from the mean can be as large as 20 percent.
Gibson J. L.
Siegmund Oswald H. W.
Vallerga John V.
Vedder Peter W.
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