Fast triggering in silicon drift detectors by means of holes' induction

Details Fast triggering in silicon drift detectors by means of holes' induction Fast triggering in silicon drift detectors by means of holes' induction

Feb 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004nimpa.518..429c&link_type=abstract

Nuclear Instruments and Methods in Physics Research Section A, Volume 518, Issue 1-2, p. 429-432.

Physics

3

Self-Triggering, Silicon Drift Detectors, Controlled Drift Detectors, Fast Event Coincidence, X-Ray Imaging, Compton Telescope

Scientific paper

The signal induced by electrons and holes on the p+ strips close to the interaction point can provide a very precise time mark of the photon interaction in a Silicon Drift Detector (SDD). A detailed study of the shape of the induced signals and of the parameters affecting the achievable time resolution is presented together with the first experimental tests on a linear SDD. The measured time resolution of the trigger signal is 1.5nsr.m.s.. Such a fast trigger makes possible the use of SDDs as high resolution X-ray imagers and opens to the development of novel Compton telescopes for γ-ray imaging based on Controlled Drift Detectors.

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