Physics – Optics
Scientific paper
Sep 1994
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1994spie.2210..728l&link_type=abstract
Proc. SPIE Vol. 2210, p. 728-738, Space Optics 1994: Space Instrumentation and Spacecraft Optics, Thierry M. Dewandre; Joachim J
Physics
Optics
Scientific paper
The far ultraviolet (FUV) reflectance of an unoxidized thin aluminum film, prepared and maintained under UHV conditions, was measured. Reflectance versus the angle of incidence was measured in two perpendicular planes of incidence. The complex refractive index of aluminum was obtained from those reflectance measurements, taking into account the scattering induced by the surface roughness. The results here shown allow the calculation of reflectance of aluminum coatings and multilayers containing aluminum for application in FUV optical instruments operating outside the atmosphere.
Aznarez-Candao Jose A.
Larruquert Juan Ignacio
Mendez-Morales Jose A.
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