Exploring macroscopic surface structures on X-ray CCDs using silicon absorption edge quantum efficiency measurements

Details Exploring macroscopic surface structures on X-ray CCDs using silicon absorption edge quantum efficiency measurements Exploring macroscopic surface structures on X-ray CCDs using silicon absorption edge quantum efficiency measurements

May 1995

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1995nimpb..97..316k&link_type=ejournal

Nuclear Instruments and Methods in Physics Research Section B, v. 97, p. 316-321

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