Exploiting quantum parallelism of entanglement for a complete experimental quantum characterization of a single qubit device

Details Exploiting quantum parallelism of entanglement for a complete experimental quantum characterization of a single qubit device Exploiting quantum parallelism of entanglement for a complete experimental quantum characterization of a single qubit device

2002-10-31

arxiv.org/abs/quant-ph/0210210v1

Phys. Rev. A 87 062307 (2003)

Physics

Quantum Physics

4 pages in revtex4 with 4 eps figures

Scientific paper

10.1103/PhysRevA.67.062307

We present the first full experimental quantum tomographic characterization
of a single-qubit device achieved with a single entangled input state. The
entangled input state plays the role of all possible input states in quantum
parallel on the tested device. The method can be trivially extended to any
n-qubits device by just replicating the whole experimental setup n times.

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