Experimental Study of Single-Event Transient Current in SOI Devices

Details Experimental Study of Single-Event Transient Current in SOI Devices Experimental Study of Single-Event Transient Current in SOI Devices

Oct 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004esasp.536..305h&link_type=gif

Radiation and its Effects on Components and Systems, RADECS 2003, Proceedings of the 7th European Conference, held 15-19 Septemb

Computer Science

Scientific paper

Not Available

Affiliated with

Also associated with

No associations

Rating

Experimental Study of Single-Event Transient Current in SOI Devices does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Experimental Study of Single-Event Transient Current in SOI Devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Experimental Study of Single-Event Transient Current in SOI Devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-839591