Computer Science
Scientist
Development of Monte Carlo Modeling for Proton Induced Charge in Si PIN Photodiode
Experimental Study of Single-Event Transient Current in SOI Devices
Radiation Damage of InGaAs Photodiodes by High-Temperature Electron and Neutron Irradiation
Temperature Dependence of Single-Event Transient Current Induced by Heavy Ion Microbeam on p+/n/n+ Epilayer Junctions
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