Examining Martian Alteration Products Using In Situ TEM Sectioning: A Novel Application of the Focused Ion Beam (FIB) for the Study of Extraterrestrial Materials

Details Examining Martian Alteration Products Using In Situ TEM Sectioning: A Novel Application of the Focused Ion Beam (FIB) for the Study of Extraterrestrial Materials Examining Martian Alteration Products Using In Situ TEM Sectioning: A Novel Application of the Focused Ion Beam (FIB) for the Study of Extraterrestrial Materials

Mar 1999

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999lpi....30.2005v&link_type=abstract

30th Annual Lunar and Planetary Science Conference, March 15-29, 1999, Houston, TX, abstract no. 2005

Physics

3

Scientific paper

This represents the first known use of the focused ion beam (FIB) method
of in situ TEM specimen preparation for the study of SNC secondary
alteration. Microstratigraphy of "iddingsite" from the Lafayette
meteorite has been examined.

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