Evaluation technique of MTFe for sampled imaging systems

Details Evaluation technique of MTFe for sampled imaging systems Evaluation technique of MTFe for sampled imaging systems

Nov 1990

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990spie.1334..216s&link_type=toc

Proc. SPIE Vol. 1334, p. 216-220, Current Developments in Optical Engineering IV, Robert E. Fischer; Warren J. Smith; Eds.

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