Evaluation of Standards for Silicon Analysis in Germanium Genesis Collectors by SIMS-AMS

Details Evaluation of Standards for Silicon Analysis in Germanium Genesis Collectors by SIMS-AMS Evaluation of Standards for Silicon Analysis in Germanium Genesis Collectors by SIMS-AMS

Mar 2010

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2010lpi....41.2729c&link_type=abstract

41st Lunar and Planetary Science Conference, held March 1-5, 2010 in The Woodlands, Texas. LPI Contribution No. 1533, p.2729

Physics

Scientific paper

Recent efforts at the NRL SIMS-AMS facility have focused on Si
measurements towards evaluating the possibility of Si analysis in
Genesis collectors. We have begun to evaluate the use of the Ge
substrate material for Genesis measurements.

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