Evaluation of properties of various type CdTe hard x-ray detectors

Details Evaluation of properties of various type CdTe hard x-ray detectors Evaluation of properties of various type CdTe hard x-ray detectors

Aug 2005

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005spie.5922..195t&link_type=abstract

Hard X-Ray and Gamma-Ray Detector Physics VII. Edited by James, Ralph B.; Franks, Larry A.; Burger, Arnold. Proceedings of the

Physics

Scientific paper

M-π -n detector and Schottky detector which were different barriers were evaluated by measuring spectrum as imaging detectors. These spectrum performances showed that the effect of polarization in these detectors was similarly occurred. The current-time characteristics and capacitance-time characteristics were measured for the detectors and it was found that these characteristics were due to the effect of polarization.

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