Epitaxial Growth Of Y2O3 On Biaxially Textured Ni Tapes Using A Sol-Gel Process For YBCO Coated Conductors

Details Epitaxial Growth Of Y2O3 On Biaxially Textured Ni Tapes Using A Sol-Gel Process For YBCO Coated Conductors Epitaxial Growth Of Y2O3 On Biaxially Textured Ni Tapes Using A Sol-Gel Process For YBCO Coated Conductors

Apr 2007

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2007aipc..899..620c&link_type=abstract

SIXTH INTERNATIONAL CONFERENCE OF THE BALKAN PHYSICAL UNION. AIP Conference Proceedings, Volume 899, pp. 620-620 (2007).

Physics

Ceramics And Refractories, Liquid Phase Epitaxy, Deposition From Liquid Phases

Scientific paper

A solution processing technique was used to deposit an epitaxial Y2O3 film on (001)[100] cube textured Ni tapes for YBa2Cu3Ox (YBCO) coated conductors manufacturing. The cube texture was developed in Ni by a conventional thermo-mechanical process. A precursor solution of yttrium 2-methoxyethoxide in 2-methoxyethanol was spin-coated on the Ni substrate. The as-deposited amorphous film was thermally treated at 1100°C in a flowing Ar+4%H2 gas mixture. The θ-2θ X-ray spectra revealed predominantly (001) reflections, indicating a high degree of out-of-plane orientation. Pole figures for the (222) Y2O3 reflections demonstrate a single in-plane texture. The out-of-plane and in-plane epitaxial relationship is [400]Y2O3//[200] Ni and [110]Y2O3//[100] Ni, respectively. The full-width-half-maximum (FWHM) of the ω-scans and φ-scans is 6° and 11°, respectively.

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