Environment Assisted Metrology with Spin Qubit

Details Environment Assisted Metrology with Spin Qubit Environment Assisted Metrology with Spin Qubit

2012-01-12

arxiv.org/abs/1201.2684v1

Physics

Quantum Physics

9 pages, 6 figures

Scientific paper

We investigate the sensitivity of a recently proposed method for precision measurement [Phys. Rev. Lett. 106, 140502 (2011)], focusing on an implementation based on solid-state spin systems. The scheme amplifies a quantum sensor response to weak external fields by exploiting its coupling to spin impurities in the environment. We analyze the limits to the sensitivity due to decoherence and propose dynamical decoupling schemes to increase the spin coherence time. The sensitivity is also limited by the environment spin polarization; therefore we discuss strategies to polarize the environment spins and present a method to extend the scheme to the case of zero polarization. The coherence time and polarization determine a figure of merit for the environment's ability to enhance the sensitivity compared to echo-based sensing schemes. This figure of merit can be used to engineer optimized samples for high-sensitivity nanoscale magnetic sensing, such as diamond nanocrystals with controlled impurity density.

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