Ellipsometric measurements by use of photon pairs generated by spontaneous parametric down-conversion

Physics – Quantum Physics

Scientific paper

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10 pages, accepted for publication in Optics Letters

Scientific paper

10.1364/OL.26.001717

We present a novel interferometric technique for performing ellipsometric measurements. This technique relies on the use of a non-classical optical source, namely, polarization-entangled twin photons generated by spontaneous parametric down-conversion from a nonlinear crystal, in conjunction with a coincidence-detection scheme. Ellipsometric measurements acquired with this scheme are absolute; i.e., they do not require source and detector calibration.

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