Electro-optic spatial light modulator characterization using Mueller matrix imaging

Details Electro-optic spatial light modulator characterization using Mueller matrix imaging Electro-optic spatial light modulator characterization using Mueller matrix imaging

Oct 1997

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1997spie.3121..161s&link_type=abstract

Proc. SPIE Vol. 3121, p. 161-166, Polarization: Measurement, Analysis, and Remote Sensing, Dennis H. Goldstein; Russell A. Chipm

Physics

Scientific paper

A series of electro-optic spatial light modulators have been measured with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analytes the existing polarized state over a spatially resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in a device with lead- lanthanum-zirconate-titanate modulating material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2 X 10(superscript -16) (m/V)(superscript 2) was determined in the modulator active regions.

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