Dynamic phase microscopy: measurements of translational displacements at sub-nanometer scale

Details Dynamic phase microscopy: measurements of translational displacements at sub-nanometer scale Dynamic phase microscopy: measurements of translational displacements at sub-nanometer scale

2006-08-08

arxiv.org/abs/physics/0608093v1

Physics

Instrumentation and Detectors

6 pages, 5 figures

Scientific paper

Dynamic phase microscopy has been applied for measurements of nanometer-scale
displacements of a piezoelectric scanner. This scanner, which was designed for
calibration purposes for scanning probe microscopy and TEM, exhibited a linear
and hysteresis-free translation in the 0.05-20 nm range. The voltage-activated
motion is described by a coefficient of 0.03 \pm 0.005 nm/V.

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