Dual Beam Sputter Depth Profiling of Genesis Solar Wind Collectors by RIMS

Details Dual Beam Sputter Depth Profiling of Genesis Solar Wind Collectors by RIMS Dual Beam Sputter Depth Profiling of Genesis Solar Wind Collectors by RIMS

Mar 2012

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2012lpi....43.2296v&link_type=abstract

43rd Lunar and Planetary Science Conference, held March 19–23, 2012 at The Woodlands, Texas. LPI Contribution No. 1659, id.2296

Physics

1

Scientific paper

We achieved a breakthrough in accuracy of the RIMS method applied to
analyses of Genesis solar wind (SW) samples. For the first time, we
measured depth profiles of Mg, Ca, and Cr corresponding to different SW
regimes and determined their fluences.

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