Development of Ground-testable Phase Fresnel Lenses in Silicon

Details Development of Ground-testable Phase Fresnel Lenses in Silicon Development of Ground-testable Phase Fresnel Lenses in Silicon

2006-01-03

arxiv.org/abs/physics/0601012v1

Exper.Astron.20:299-306,2005

Physics

Optics

Presented at GammaWave05: "Focusing Telescopes in Nuclear Astrophysics", Bonifacio, Corsica, September 2005, to be published i

Scientific paper

10.1007/s10686-006-9030-9

Diffractive/refractive optics, such as Phase Fresnel Lenses (PFL's), offer the potential to achieve excellent imaging performance in the x-ray and gamma-ray photon regimes. In principle, the angular resolution obtained with these devices can be diffraction limited. Furthermore, improvements in signal sensitivity can be achieved as virtually the entire flux incident on a lens can be concentrated onto a small detector area. In order to verify experimentally the imaging performance, we have fabricated PFL's in silicon using gray-scale lithography to produce the required Fresnel profile. These devices are to be evaluated in the recently constructed 600-meter x-ray interferometry testbed at NASA/GSFC. Profile measurements of the Fresnel structures in fabricated PFL's have been performed and have been used to obtain initial characterization of the expected PFL imaging efficiencies.

Affiliated with

Also associated with

No associations

Rating

Development of Ground-testable Phase Fresnel Lenses in Silicon does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Development of Ground-testable Phase Fresnel Lenses in Silicon, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Development of Ground-testable Phase Fresnel Lenses in Silicon will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-491505