Development of an Automatic Birefringence Measuring Device of Mirror Substrates for LCGT

Details Development of an Automatic Birefringence Measuring Device of Mirror Substrates for LCGT Development of an Automatic Birefringence Measuring Device of Mirror Substrates for LCGT

Mar 2007

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2007ebhe.conf..382t&link_type=abstract

ENERGY BUDGET IN THE HIGH ENERGY UNIVERSE . Proceedings of the International Workshop. Held 22-24 February 2006 in Kashiwa, Japa

Physics

Scientific paper

We developed an automatic measuring device of birefringence inhomogeneity in synthetic sapphire substrates to evaluate their crystal quality suitable for laser interferometric gravitational wave (GW) detectors. The phase retardation was measured with an accuracy of 7 × 10-4 rad and the orientation of the fast axis with an accuracy of 2 × 10-2 rad. The automatic measuring device is useful to check the inhomogeneity of substrates for the LCGT project, which is a next-generation laser interferometer project for GW detection.

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