Development of a Resonance Ionization Method for Isotopic Analysis of Neodymium at Trace Levels in Presolar SiC Grains

Details Development of a Resonance Ionization Method for Isotopic Analysis of Neodymium at Trace Levels in Presolar SiC Grains Development of a Resonance Ionization Method for Isotopic Analysis of Neodymium at Trace Levels in Presolar SiC Grains

Mar 2012

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2012lpi....43.2401l&link_type=abstract

43rd Lunar and Planetary Science Conference, held March 19–23, 2012 at The Woodlands, Texas. LPI Contribution No. 1659, id.2401

Physics

Scientific paper

We developed a resonance ionization method with enough precision for
isotopic analysis of neodymium in single presolar silicon carbide (SiC)
grains. We analyzed two standards and agreement between both results
indicates that the method is robust.

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