Development of a low contamination camera head for the evaluation of CCDs in the UV and EUV

Astronomy and Astrophysics – Astronomy

Scientific paper

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Charge Coupled Devices, Equipment Specifications, Extreme Ultraviolet Radiation, Temperature Control, Ultraviolet Radiation, Vacuum Chambers, Contamination, Liquid Nitrogen, Stainless Steels

Scientific paper

A low contamination vacuum chamber and camera head built to test the ultraviolet and extreme ultraviolet response of charge-coupled devices are described. The vacuum chamber is of all electropolished stainless steel construction with copper seal flanges used throughout. The camera head includes a liquid-nitrogen-cooled, resistively heated thermal control system (+/- 0.1 C), and a specially recast epoxy ZIF socked. All electronic components, except wiring, are kept outside of the vacuum, eliminating major sources of organic contamination. The system is turbopumped and reaches pressures of about 10 exp -8 torr. Residual gas analysis of the system shows that partial pressures of organic contaminants are less than about 10 exp -9 torr.

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