Design, Fabrication, and Experimental Demonstration of Junction Surface Ion Traps

Details Design, Fabrication, and Experimental Demonstration of Junction Surface Ion Traps Design, Fabrication, and Experimental Demonstration of Junction Surface Ion Traps

2011-05-10

arxiv.org/abs/1105.1834v1

New J.Phys.13:075018,2011

Physics

Quantum Physics

9 pages, 6 figures

Scientific paper

10.1088/1367-2630/13/7/075018

We present the design, fabrication, and experimental implementation of surface ion traps with Y-shaped junctions. The traps are designed to minimize the pseudopotential variations in the junction region at the symmetric intersection of three linear segments. We experimentally demonstrate robust linear and junction shuttling with greater than one million round-trip shuttles without ion loss. By minimizing the direct line of sight between trapped ions and dielectric surfaces, negligible day-to-day and trap-to-trap variations are observed. In addition to high-fidelity single-ion shuttling, multiple-ion chains survive splitting, ion-position swapping, and recombining routines. The development of two-dimensional trapping structures is an important milestone for ion-trap quantum computing and quantum simulations.

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