Depth Sensitive Sampling of Implanted Species in Genesis Collectors Using UV Laser Ablation and SIMS

Details Depth Sensitive Sampling of Implanted Species in Genesis Collectors Using UV Laser Ablation and SIMS Depth Sensitive Sampling of Implanted Species in Genesis Collectors Using UV Laser Ablation and SIMS

Mar 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004lpi....35.1681f&link_type=abstract

35th Lunar and Planetary Science Conference, March 15-19, 2004, League City, Texas, abstract no.1681

Physics

Scientific paper

SIMS profiling of laser abalation pits in CVD diamond implanted with
oxygen- 18 shows that homogenised 193nm excimer laser beam can
successfully ablate a layer a few nm thick, removing surface
contamination without signicant loss of implanted sample.

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