Deep Space 3 metrology system

Details Deep Space 3 metrology system Deep Space 3 metrology system

Jul 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998spie.3350..616d&link_type=abstract

Proc. SPIE Vol. 3350, p. 616-625, Astronomical Interferometry, Robert D. Reasenberg; Ed.

Astronomy and Astrophysics

Astronomy

Scientific paper

A metrology subsystem on board the Deep Space 3, a separated spacecraft interferometer mission, is used to determine stellar fringe delay jitter, delay rate, and initial delay. The subsystem implements two capabilities: linear metrology for optical pathlength determination and angular metrology needed to determine the configuration and orientation of the spacecraft constellation. Frequency modulated metrology concept is used to implement high-precision interferometric linear measurements over large target ranges. System is made angle sensitive by using an articulated flat mirror at the target.

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