Deceleration and electrostatic trapping of OH radicals

Details Deceleration and electrostatic trapping of OH radicals Deceleration and electrostatic trapping of OH radicals

2004-07-22

arxiv.org/abs/physics/0407116v1

Phys. Rev. Lett. 94, 023004 (2005)

Physics

Atomic Physics

4 pages, 3 figures

Scientific paper

10.1103/PhysRevLett.94.023004

A pulsed beam of ground state OH radicals is slowed down using a Stark decelerator and is subsequently loaded into an electrostatic trap. Characterization of the molecular beam production, deceleration and trap loading process is performed via laser induced fluorescence detection inside the quadrupole trap. Depending on details of the trap loading sequence, typically $10^5$ OH ($X^2\Pi_{3/2}, J=3/2$) radicals are trapped at a density of around $10^7$ cm$^{-3}$ and at temperatures in the 50-500 mK range. The 1/e trap lifetime is around 1.0 second.

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