Dark-field optical microscopy in semiconductor materials: a typical answerable inverse problem

Details Dark-field optical microscopy in semiconductor materials: a typical answerable inverse problem Dark-field optical microscopy in semiconductor materials: a typical answerable inverse problem

Nov 1990

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990spie.1351..173f&link_type=ejournal

Proc. SPIE Vol. 1351, p. 173-180, Digital Image Synthesis and Inverse Optics, Arthur F. Gmitro; Paul S. Idell; Ivan J. LaHaie; E

Physics

Optics

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